_exptl.entry_id datablock1
_exptl.absorpt_coefficient_mu 1.22
_exptl.absorpt_correction_T_max 0.896
_exptl.absorpt_correction_T_min 0.802
_exptl.absorpt_correction_type integration
_exptl.absorpt_process_details
;
Gaussian grid method from SHELX76
Sheldrick, G. M., "SHELX-76: structure determination and
refinement program", Cambridge University, UK, 1976
;
_exptl.crystals_number 1
_exptl.details
;
Enraf-Nonius LT2 liquid nitrogen variable-temperature device used
;
_exptl.method 'single-crystal x-ray diffraction'
_exptl.method_details
;
graphite monochromatized Cu K(alpha) fixed tube and
Enraf-Nonius CAD4 diffractometer used
;