_exptl.entry_id                    datablock1
    _exptl.absorpt_coefficient_mu      1.22
    _exptl.absorpt_correction_T_max    0.896
    _exptl.absorpt_correction_T_min    0.802
    _exptl.absorpt_correction_type     integration      
    _exptl.absorpt_process_details     
    ;
     Gaussian grid method from SHELX76
     Sheldrick, G. M., "SHELX-76: structure determination and 
     refinement program", Cambridge University, UK, 1976
    ;
    _exptl.crystals_number             1
    _exptl.details                
    ;
     Enraf-Nonius LT2 liquid nitrogen variable-temperature device used
    ;
    _exptl.method                 'single-crystal x-ray diffraction'
    _exptl.method_details              
    ;
     graphite monochromatized Cu K(alpha) fixed tube and 
     Enraf-Nonius CAD4 diffractometer used
    ;