The overall standard uncertainty (e.s.d.) of the positional parameters based on a maximum likelihood residual. The overall standard uncertainty (sigma_X)^{2 gives an idea of the uncertainty in the position of averagely defined atoms (atoms with B values equal to average B value) 3 N_a (sigma_X)}2 = ----------------------------------------------------- 8 pi^{2 sum_i {(1/Sigma - (E_o)}2 (1-m^2)(SUM_AS)s2} SUM_AS = (sigma_A)^2/Sigma2) N_a = number of atoms Sigma = (sigma_{E;exp})^{2 + epsilon (1-{sigma_A)}2) E_o = normalized structure factors sigma_{E;exp} = experimental uncertainties of normalized structure factors sigma_A = <cos 2 pi s delta_x> SQRT(Sigma_P/Sigma_N) estimated using maximum likelihood Sigma_P = sum_{atoms in model} f^{2 Sigma_N = sum_{atoms in crystal} f}2 f = is form factor of atoms delta_x = expected error m = is figure of merit of phases of reflection included in summation delta_x expected error s = reciprocal space vector epsilon = multiplicity of diffracting plane summation is over all reflections included in refinement Ref: (sigma_A estimation) "Refinement of Macromolecular Structures by the Maximum-Likelihood Method", Murshudov, G. N., Vagin A. A. & Dodson, E. J. (1997). Acta Cryst. D53, 240-255. (SU ML estimation) "Simplified error estimation a la Cruickshank in macromolecular crystallography", Murshudov G. N. & Dodson E. J. (1997). CCP4 Newsletter, no. 33. http://www.dl.ac.uk/CCP/CCP4/newsletter33/