| Allowed Value | Details | 
|---|---|
| population | Standard deviation from a population of many crystals, for example from serial crystallography | 
| propagated | Propagated error from several crystals | 
| refined | Errors are derived from a refined fit of the cell parameters to the data and represent the precision of that fit | 
| scan varying | Error using a scan varying restraint across the crystal as a whole | 
| single crystal | ESD for a single crystal | 
| window | ESD from measuring the unit cell using a moving window across many frames | 
| Allowed Value | Details | 
|---|---|
| population | Standard deviation from a population of many crystals, for example from serial crystallography | 
| propagated | Propagated error from several crystals | 
| refined | Errors are derived from a refined fit of the cell parameters to the data and represent the precision of that fit | 
| scan varying | Error using a scan varying restraint across the crystal as a whole | 
| single crystal | ESD for a single crystal | 
| window | ESD from measuring the unit cell using a moving window across many frames |